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Journal: Electronics, 2024
Volume: 13
Number: 1573

Article: Channel Potential of Bandgap-Engineered Tunneling Oxide (BE-TOX) in Inhibited 3D NAND Flash Memory Strings
Authors: by Taeyoung Cho, Sungyeop Jung and Myounggon Kang
Link: https://www.mdpi.com/2079-9292/13/8/1573

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