Nondestructive Evaluation for Comprehensive Material Characterization

Dear Colleagues,

Non-destructive evaluation technology is essential for improving the safety management and reliability of manufactured products in various industries (such as aerospace, semiconductor, secondary battery, automobile, and power plant industries).

With the development of science and technology, new materials appear and technology development must be made to improve the reliability of non-destructive evaluation.

For evaluating new material integrity and properties, non-destructive evaluation techniques such as ultrasound testing (UT), phased-array ultrasound testing (PAUT), radiographic testing (RT), digital radiographic testing (DRT), and eddy current testing (ECT), among others, are proposed.

Artificial intelligence and machine learning approaches are being studied with renewed interest across scientific disciplines, and non-destructive evaluation techniques are no exception.

In this Special Issue of Materials, we welcome the following studies: original studies, including theoretical, numerical, experimental, or combined analyses; laboratory studies; field application studies; structure health monitoring (SHM) studies; NDE simulation modelling studies; artificial intelligence technology studies; and studies on the probability of detection (POD) and related reliability metrics.

Moreover, other studies on the non-destructive evaluation of materials are welcome.

Original research for innovative advances in non-destructive evaluation technology is an invaluable scientific contribution.

Prof. Dr. Ik-Keun Park
Prof. Dr. Jai-Won Byeon
Dr. Chungseok Kim
Guest Editors

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• non-destructive testing and evaluation (NDT&NDE)
• material characterization (stress, strain, and mechanical property measurements)
• phased-array ultrasound testing (UT&PAUT)
• scanning acoustic microscope (SAM)
• acoustic emission applications
• non-linear ultrasound applications
• terahertz ultrasound applications
• guided wave techniques
• radiographic testing (RT) and digital radiographic testing (DRT)
• eddy current and electromagnetics
• digital optical (holography, etc.) convergence application
• wave propagation and scattering
• NDE simulation modeling
• reliability evaluation (probability of detection—POD)
• artificial intelligence and machine learning